CITCOM – 12 Partners – One Mission

CITCOM aims to develop an in-line inspection, measurement and control system for high reliability and detailed monitoring and inspection of MEMS, micro-components and micro-devices based on a 3D optical quality inspection system, robotic manipulation for sorting and nano-focused 2D X-ray system.

We are CITCOM! We make it happen!

driven by industrial needs – supported by cutting edge technology portfolios – implemented by leading researchers and engineers distributed across Europe

More about us…